سال انتشار: ۱۳۸۸

محل انتشار: سومین کنفرانس نانوساختارها

تعداد صفحات: ۴

نویسنده(ها):

H Fatemi – Physics Department, Shahid Bahonar University of Kerman, Kerman, Iran
A Khaksar – Physics Department, Shahid Bahonar University of Kerman, Kerman, Iran

چکیده:

In this report, a more accurate approach to find the intensity profile of the light emerged from a Tapered Fiber Probe (TFP) in its very near-field (VN-F) zone of emanation, is presented. Results exhibit a transversal, as well as, an axial intensity variation in this region. The frequency of variations depends on the geometry of the proposed TFP. Considering these intensity fluctuations, can be remarkable in designing of Micro/Nano Optical circuits in which TFPs are used.